Lifetime characterization of capacitive RF MEMS switches
- Author(s):
- Ziaei, A. ( Thales Research and Technology (France) )
- Dean, T. ( Thales Research and Technology (France) )
- Polizzi, J.-P. ( Thales Research and Technology (France) )
- Publication title:
- Reliability, Packaging, Testing, and Characterization of MEMS/MOEMS IV
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5716
- Pub. Year:
- 2005
- Page(from):
- 113
- Page(to):
- 121
- Pages:
- 9
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819456908 [081945690X]
- Language:
- English
- Call no.:
- P63600/5716
- Type:
- Conference Proceedings
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