Cell damage during femtosecond optical trapping

Cell damage during femtosecond optical trapping

Author(s):

Im, K.-B. ( Yonsei Univ. (South Korea) )

Han, S. ( Yonsei Univ. (South Korea) )

Park, H. ( Yonsei Univ. (South Korea) )

Jin, D. ( Yonsei Univ. (South Korea) )

Kim, S.-K. ( Yonsei Univ. (South Korea) )

Kim, B.-M. ( Yonsei Univ. (South Korea) )

1 more

Publication title:

Imaging, Manipulation, and Analysis of Biomolecules and Cells: Fundamentals and Applications III

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5699

Pub. Year:

2005

Page(from):

274

Page(to):

280

Pages:

7

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

16057422

ISBN:

9780819456731 [081945673X]

Language:

English

Call no.:

P63600/5699

Type:

Conference Proceedings

Details

TDL ID:	ZA00014916
Series ID:	PA00000029
Conf. info. (Name):	SPIE BiOS : Imaging, manipulation, and analysis of biomolecules and cells
Conf. info. (Number):	2005 : 3rd
Conf. info. (Venue):	San Jose, CA, USA
Conf. info. (Date):	2005.01.24-2005.01.27

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