Edge-and-corner-directed interpolation
- Author(s):
- Kim, H. ( Electronics and Telecommunications Research Institute (South Korea) )
- Park, C. -J. ( Electronics and Telecommunications Research Institute (South Korea) )
- Kim, S. -E. ( Electronics and Telecommunications Research Institute (South Korea) )
- Lee, I. -H. ( Electronics and Telecommunications Research Institute (South Korea) )
- Publication title:
- Image processing : algorithms and systems IV : 17-18 January 2005, San Jose, California, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5672
- Pub. Year:
- 2005
- Page(from):
- 269
- Page(to):
- 276
- Pages:
- 8
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819456458 [0819456454]
- Language:
- English
- Call no.:
- P63600/5672
- Type:
- Conference Proceedings
Similar Items:
Society of Plastics Engineers, Inc. (SPE) |
SPIE - The International Society of Optical Engineering |
2
Conference Proceedings
A Direct Electro-reduction of Silver Compounds: Application to the Preparation of Fine Silver Powder
Electrochemical Society |
Electrochemical Society |
SPIE - The International Society for Optical Engineering |
Elsevier |
4
Conference Proceedings
Digital TV image quality improvement considering distributions of edge characteristic
SPIE - The International Society of Optical Engineering |
10
Conference Proceedings
The fast stereo sequence compression using edge-directional joint disparity-motion estimation
SPIE - The International Society of Optical Engineering |
SPIE - The International Society for Optical Engineering |
11
Conference Proceedings
Bell-shapesd light emitting diodes(BS-LED) with a 45 deg. corner reflector, deep side-wall, and microlens
SPIE-The International Society for Optical Engineering |
6
Conference Proceedings
Reduction of wafer-scale error between DI and FI in multilevel metallization hy adjusting edge detedion method
SPIE - The International Society for Optical Engineering |
12
Conference Proceedings
Improved characteristics of rainbow defects with novel wafer edge exposure technique
SPIE-The International Society for Optical Engineering |