A scalable SIMD digital signal processor for high-quality multifunctional printer systems

A scalable SIMD digital signal processor for high-quality multifunctional printer systems

Author(s):

Kang, H. -J. ( Korea Advanced Institute of Science and Technology (South Korea) )

Choi, Y. ( Korea Advanced Institute of Science and Technology (South Korea) )

Kim, K. ( Korea Advanced Institute of Science and Technology (South Korea) )

Park, I. -C. ( Korea Advanced Institute of Science and Technology (South Korea) )

Kim, J. -W. ( Samsung Electronics Co., Ltd. (South Korea) )

Lee, E. -H. ( Samsung Electronics Co., Ltd. (South Korea) )

Gahang, G. -S. ( Samsung Electronics Co., Ltd. (South Korea) )

2 more

Publication title:

Color imaging X : processing, hardcopy, and applications : 17-20 January 2005, San Jose, California, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5667

Pub. Year:

2005

Page(from):

448

Page(to):

456

Pages:

9

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819456403 [0819456403]

Language:

English

Call no.:

P63600/5667

Type:

Conference Proceedings

Details

TDL ID:	ZA00014884
Series ID:	PA00000029
Conf. info. (Name):	IS&T/SPIE Electronic Imaging : Color imaging
Conf. info. (Number):	2005 : 10th
Conf. info. (Venue):	San Jose, CA, USA
Conf. info. (Date):	2005.01.17-2005.01.20

Similar Items:

1 Conference Proceedings Fabrication and integration of micro/nano-scale optical wire circuit arrays and devices for high-speed and compact optical printed circuit board (O-PCB) and … Lee, E., Lee, S. G., Park, B. H. O, S. G., Kim, K. H., Kang, J. K., Choi, Y. W., Song, S. H. SPIE - The International Society of Optical Engineering	7 Conference Proceedings Fulfillment of model-based OPC for contact patterns in 60-nm level logic device Kim, S.-W., Lee, S.-W., Park, C.-M., Choi, S.-H., Lee, Y.-M., Kang, Y., Yeo, G.-S., Lee, J.-H., Cho, H.-K., Han, W.-S. SPIE - The International Society of Optical Engineering
2 Conference Proceedings Development and evaluation of a selenium-based flat-panel digital x-ray detector system based on quality factor Park, J.K., Choi, J.Y., Kang, S.S., Mun, C.W., Lee, H.W., Nam, S.H. SPIE-The International Society for Optical Engineering	8 Conference Proceedings Aberration sensitivity control for the isolation layer in low-k1 DRAM process Cho, B.-H., Yim, D., Park, C.-H., Lee, S.-H., Yang, H.-J., Choi, J.-H., Shin, Y.-C., Kim, C.-D., Choi, J.-S., Kang, … SPIE-The International Society for Optical Engineering
3 Conference Proceedings Fabrication and integration of micro/nano-scale photonic devices and optical waveguide arrays for optical printed circuit board (O-PCB) and VLSI photonic … Lee, E. -H., Lee, S. G., Park, B. H. O. S. G., Kim, K. H., Kang, J. K., Choi, Y. W. SPIE - The International Society of Optical Engineering	9 Conference Proceedings Spatial optical modulator (SOM): high-density diffractive laser projection display S. Yun, J. Song, I. Yeo, Y. Choi, V. Yurlov, S. An, H. Park, H. Yang, Y. Lee, K. Han, I. Shyshkin, A. Lapchuk, K. Oh, S. … SPIE - The International Society of Optical Engineering
4 Conference Proceedings Optimum field-size strategy for DRAM mass production in low-k1 process Park,C.-H., Yim,D., Lee,S.-H., Yang,H.-J., Choi,J.-H., Shin,Y.-C., Kim,C.-D., Choi,J.-S., Kang,K.-O., Kim,S.-W., … SPIE-The International Society for Optical Engineering	10 Conference Proceedings Impact of mask defect in a high MEEF process Jeong, C.-Y., Park, K.-Y., Choi, J.S., Lee, J.G., Lee, D.-H. SPIE-The International Society for Optical Engineering
5 Conference Proceedings Fabrication and integration of micro/nano-scale polymer optical waveguides and devices for optical printed circuit board (O-PCB) application (Invited Paper) Lee, E.-H., Lee, S.G., Park, B.H.O.S.G., Kim, K.H., Kang, J.K., Chin, I., Kwon, Y.K., Choi, Y.W. SPIE - The International Society of Optical Engineering	11 Conference Proceedings Implementation of real-time digital endoscopic image processing system Song,C.G., Lee,Y.M., Lee,S.M., Kim,W.K., Lee,J.H., Lee,M.H. SPIE-The International Society for Optical Engineering
6 Conference Proceedings Novel 193-nm single-layer resist containing a multifunctional monomer Lee, G., Koh, C. -W., Jung, J. -C., Jung, M. -H., Kim, H. -S., Baik, K. -H., Choi, I. -H. SPIE - The International Society of Optical Engineering	12 Conference Proceedings X-ray detection properties of polycrystalline Cd1-xZnxTe detectors for digital radiography Kang, S.S., Park, J.K., Lee, D.G., Mun, C.W., Kim, J.H., Nam, S.H. SPIE-The International Society for Optical Engineering

1

2

3

4

5

6

7

8

9

10

11

12