Highly sensitive method for measuring the onset of damage using a microchannel plate

Highly sensitive method for measuring the onset of damage using a microchannel plate

Author(s):

Schwarz, J. ( Sandia National Labs. (USA) )
Ruggles, L. E. ( Sandia National Labs. (USA) )
Rambo, P. K. ( Sandia National Labs. (USA) )
Porter, J. L. ( Sandia National Labs. (USA) )

Publication title:

Laser-Induced Damage in Optical Materials: 2004

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5647

Pub. Year:

2004

Page(from):

379

Page(to):

384

Pages:

6

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819456076 [0819456071]

Language:

English

Call no.:

P63600/5647

Type:

Conference Proceedings

Details

TDL ID:	ZA00014863
Series ID:	PA00000029
Conf. info. (Name):	Laser Damege : Laser-Induced Damage in Optical Materials ; Annual Boulader Damage Symposium
Conf. info. (Number):	2004 ; 36th
Conf. info. (Venue):	Boulder, CO, USA
Conf. info. (Date):	2004.09.20-2004.09.22

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