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Theoretical and numerical analysis of polarization properties used as Doppler velocimetry in vertical-cavity surface-emitting lasers

Author(s):
Lv, L. ( Univ. of Science and Technology of China (China) )
Gui, H. ( Univ. of Science and Technology of China (China) )
Zhao, T. ( Univ. of Science and Technology of China (China) )
Xu, J. ( Univ. of Science and Technology of China (China) )
He, D. ( Univ. of Science and Technology of China (China) )
Wang, A. ( Univ. of Science and Technology of China (China) )
Chen, X. ( Univ. of Science and Technology of China (China) )
Li, F. ( Univ. of Science and Technology of China (China) )
Ming, H. ( Univ. of Science and Technology of China (China) )
Xie, J. ( Univ. of Science and Technology of China (China) )
5 more
Publication title:
Optoelectronic Devices and Integration
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5644
Pub. date:
2004
Page(from):
829
Page(to):
834
Pages:
6
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819455994 [0819455997]
Language:
English
Call no.:
P63600/5644-2
Type:
Conference Proceedings

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