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The experimental research of reliability of optical pickup head

Author(s):
  • Liao, B. ( Tianjin Samsung Electronics Co., Ltd. (China) and Tianjin Univ. (China) )
  • Zhang, Y. ( Tianjin Univ. (China) )
  • Shang, Z. ( Tianjin Samsung Electronics Co., Ltd. (China) )
  • Zhao, L. ( Nankai Univ. (China) )
  • Zhao, Q. ( Nankai Univ. (China) )
Publication title:
Advances in optical data storage technology : 8-10 November, 2004, Beijing, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5643
Pub. Year:
2004
Page(from):
218
Page(to):
222
Pages:
5
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819455987 [0819455989]
Language:
English
Call no.:
P63600/5643
Type:
Conference Proceedings

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