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Evaluation of dislocation densities in HgCdTe films by high-resolution x-ray diffraction

Author(s):
  • Wang, Q. ( Shanghai Institute of Technical Physics, CAS (China) )
  • Yang, J. ( Shanghai Institute of Technical Physics, CAS (China) )
  • Wei, Y. ( Shanghai Institute of Technical Physics, CAS (China) )
  • Fang, W. ( Shanghai Institute of Technical Physics, CAS (China) )
  • He, L. ( Shanghai Institute of Technical Physics, CAS (China) )
Publication title:
Infrared components and their applications : 8-11 November 2004, Beijing, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5640
Pub. Year:
2004
Page(from):
629
Page(to):
636
Pages:
8
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819455956 [0819455954]
Language:
English
Call no.:
P63600/5640
Type:
Conference Proceedings

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