The application study of the infrared imaging technology on the transformer fault diagnosis

The application study of the infrared imaging technology on the transformer fault diagnosis

Author(s):

Hou, P. ( Yanshan Univ. (China) )
Wang, Y. ( Yanshan Univ. (China) )
Meng, Z. ( Yanshan Univ. (China) )

Publication title:

Infrared components and their applications : 8-11 November 2004, Beijing, China

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5640

Pub. Year:

2004

Page(from):

253

Page(to):

259

Pages:

7

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819455956 [0819455954]

Language:

English

Call no.:

P63600/5640

Type:

Conference Proceedings

Details

TDL ID:	ZA00014855
Series ID:	PA00000029
Conf. info. (Name):	Photonics Asia : Infrared Components and Their Applications
Conf. info. (Number):	2004
Conf. info. (Venue):	Beijing, China
Conf. info. (Date):	2004.11.08-2004.11.11

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