Diagnosis of the electron temperature in dielectric barrier discharge by optical emission spectroscopy

Diagnosis of the electron temperature in dielectric barrier discharge by optical emission spectroscopy

Author(s):

Ran, J. ( Hebei Univ. (China) )
Dong, L. ( Hebei Univ. (China) )
Mao, Z. ( Hebei Univ. (China) )
Liu, S. ( Hebei Univ. (China) )

Publication title:

Optical design and testing II : 8-12 November 2004, Beijing, China

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5638

Pub. Year:

2004

Page(from):

561

Page(to):

566

Pages:

6

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819455932 [0819455938]

Language:

English

Call no.:

P63600/5638-2

Type:

Conference Proceedings

Details

TDL ID:	ZA00014853
Series ID:	PA00000029
Conf. info. (Name):	Photonics Asia : Optical design and testing
Conf. info. (Number):	2004 : 2nd
Conf. info. (Venue):	Beijing, China
Conf. info. (Date):	2004.11.08-2004.11.12

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