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Real-time measurement of refractive index of solution during crystal growth by Michaelson interferometry

Author(s):
  • Wang, Y. ( Beijing Institute of Technology (China) )
  • Hao, Q. ( Beijing Institute of Technology (China) )
  • Zhu, O. ( Beijing Institute of Technology (China) )
Publication title:
Optical design and testing II : 8-12 November 2004, Beijing, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5638
Pub. date:
2004
Page(from):
418
Page(to):
423
Pages:
6
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819455932 [0819455938]
Language:
English
Call no.:
P63600/5638-1
Type:
Conference Proceedings

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