Blank Cover Image

An automatic system for measurement of retardation of wave plates based on phase-shifted method

Author(s):
  • Gao, Z. ( Nanjing Univ. of Science and Technology (China) )
  • Yan, M. ( No. 514 Institute of the 5th Academy of China Aerospace Science and Technoloqy Corp. (China) )
Publication title:
Optical design and testing II : 8-12 November 2004, Beijing, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5638
Pub. Year:
2004
Page(from):
164
Page(to):
168
Pages:
5
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819455932 [0819455938]
Language:
English
Call no.:
P63600/5638-1
Type:
Conference Proceedings

Similar Items:

Gonzalez-Gonzalez,H., May-Arrioja,D.A., Meneses-Nava,M.A., Tepichfn-Rodriguez,E., Sanchez-Mondragon,J.J.

SPIE - The International Society for Optical Engineering

Brokmeier,H.-G., Ermrich,M.

Trans Tech Publications

Zhang,Y., Zhang,S.

SPIE-The International Society for Optical Engineering

Zhang, S., Huang, P.S.

SPIE - The International Society of Optical Engineering

Wang, Z. P., Li, Q. B., Tan, Q., Huang, Z. J., Shi, J. H.

SPIE - The International Society of Optical Engineering

L. Lin, Y.-C. Chen, C.-H. Tsai, K. Lee

Society of Photo-optical Instrumentation Engineers

Fujigaki,M., Morimoto,Y., Gao,Q.

SPIE-The International Society for Optical Engineering

Zhong, L.Y., Zhang, Y.M., Lu, X.X., Ma, S.Z., Xiong, B.H.

SPIE-The International Society for Optical Engineering

Bo F., Zhu J.

SPIE - The International Society of Optical Engineering

P. Gao, L. Yan, H. Zhao

Society of Photo-optical Instrumentation Engineers

S. H. Simson, M. P. Kothiyal, R. S. Sirohi

SPIE - The International Society of Optical Engineering

Journet,B., Poujouly,S.

SPIE - The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12