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Rigorous electromagnetic analysis of Talbot effect with the finite-difference time-domain method

Author(s):
  • Lu, Y. ( Shanghai Institute of Optics and Fine Mechanics, CAS (China) )
  • Zhou, C. ( Shanghai Institute of Optics and Fine Mechanics, CAS (China) )
Publication title:
Optical design and testing II : 8-12 November 2004, Beijing, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5638
Pub. date:
2004
Page(from):
108
Page(to):
116
Pages:
9
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819455932 [0819455938]
Language:
English
Call no.:
P63600/5638-1
Type:
Conference Proceedings

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