A new method of ICCD imaging system MRC measurement
- Author(s):
- Li, S. ( Beijing Institute of Technology (China) and Beijing Special Vehicle Institute (China) )
- Jin, W. ( Beijing Institute of Technology (China) )
- Wang, X. ( Beijing Institute of Technology (China) )
- Zhang, W. ( Beijing Institute of Technology (China) )
- Dong, H. ( Beijing Institute of Technology (China) )
- Publication title:
- Electronic imaging and multimedia technology IV : 8-11 November 2004, Beijing, China
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5637
- Pub. Year:
- 2004
- Page(from):
- 703
- Page(to):
- 707
- Pages:
- 5
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819455925 [081945592X]
- Language:
- English
- Call no.:
- P63600/5637
- Type:
- Conference Proceedings
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