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The numerical simulation of field enhancement in near-field scanning Raman microscopy

Author(s):
  • Li, Y. ( Dalian Univ. of Technology (China) )
  • Wu, S. ( Dalian Univ. of Technology (China) )
  • Jian, G. ( Dalian Univ. of Technology (China) )
  • Liu, K. ( Dalian Univ. of Technology (China) )
Publication title:
Nanophotonics, Nanostructure, and Nanometrology
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5635
Pub. Year:
2004
Page(from):
31
Page(to):
37
Pages:
7
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819455901 [0819455903]
Language:
English
Call no.:
P63600/5635
Type:
Conference Proceedings

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