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Laser metrology in the micro-arcsecond metrology testbed

Author(s):
Publication title:
Advanced sensor systems and applications II : 8-12 November 2004, Beijing, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5634
Pub. Year:
2004
Page(from):
293
Page(to):
303
Pages:
11
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819455895 [081945589X]
Language:
English
Call no.:
P63600/5634-1
Type:
Conference Proceedings

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