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Wavelength-shifting phase-conjugate interferometry for distance measurements with an external-cavity laser diode

Author(s):
  • Maki, H. ( Univ. of Industrial Technology (Japan) )
  • Takahashi, T. ( Univ. of Industrial Technology (Japan) )
  • Ishii, Y. ( Univ. of Industrial Technology (Japan) )
Publication title:
Advanced materials and devices for sensing and imaging II : 8-10 November 2004, Beijing, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5633
Pub. Year:
2004
Page(from):
603
Page(to):
609
Pages:
7
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819455888 [0819455881]
Language:
English
Call no.:
P63600/5633
Type:
Conference Proceedings

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