
Super oblique incidence interferometer by using antireflection prism with subwavelength structure (Invited Paper)
- Author(s):
- Mizutani, Y. ( Tokyo Univ, of Agriculture and Technology (Japan) )
- Otani, Y. ( Tokyo Univ, of Agriculture and Technology (Japan) )
- Umeda, N. ( Tokyo Univ, of Agriculture and Technology (Japan) )
- Publication title:
- Advanced materials and devices for sensing and imaging II : 8-10 November 2004, Beijing, China
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5633
- Pub. Year:
- 2004
- Page(from):
- 10
- Page(to):
- 16
- Pages:
- 7
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819455888 [0819455881]
- Language:
- English
- Call no.:
- P63600/5633
- Type:
- Conference Proceedings
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