Blank Cover Image

Phase-shifting interferometry using an SHG blue laser diode (Invited Paper)

Author(s):
Publication title:
Advanced materials and devices for sensing and imaging II : 8-10 November 2004, Beijing, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5633
Pub. date:
2004
Page(from):
1
Page(to):
9
Pages:
9
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819455888 [0819455881]
Language:
English
Call no.:
P63600/5633
Type:
Conference Proceedings

Similar Items:

J. Chen, Y. Tanaka, S. Nakadate, Y. Ishii

Society of Photo-optical Instrumentation Engineers

Wu, D., Chen, J.B., Chen, L., Wu, Z.M., Lee, W.

SPIE-The International Society for Optical Engineering

Abare,A.C., Mack,M.P., Hansen,M.W., Sink,R.K., Kozodoy,P., Keller,S.L., Hu,E.L., Speck,J.S., Bowers,J.E., Mishra,U.K., …

SPIE-The International Society for Optical Engineering

Ge,A., Chen,L., Chen,J., Zhu,R.

SPIE-The International Society for Optical Engineering

Ishii, Y., Takahashi, T., Onodera, R.

SPIE-The International Society for Optical Engineering

Tanaka,Y., Shinoda,M., Yamaguchi,K., Maeda,Y.

SPIE - The International Society for Optical Engineering

Onodera, R., Ishii, Y.

SPIE-The International Society for Optical Engineering

Takahashi, T., Ishii, Y.

SPIE-The International Society for Optical Engineering

Lee, J.-L., Jang, H.W., Kim, J.K., Jeon, C.M.

SPIE-The International Society for Optical Engineering

Bitou, Y., Inaba, H., Hong, F. -L., Takatsuji, T., Onae, A.

SPIE - The International Society of Optical Engineering

Adachi M.

SPIE - The International Society of Optical Engineering

Eguchi,N., Ishibashi,A.

SPIE-The International Society for Optical Engineering

1
 
2
 
3
 
4
 
5
 
6
 
7
 
8
 
9
 
10
 
11
 
12