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Entanglement transformations in quantum A/D and D/A mappings

Author(s):
  • Chen, X. ( China Institute of Metrology (China) )
  • Li, X. ( China Institute of Metrology (China) )
  • Jiang, Y. ( China Institute of Metrology (China) )
  • Cheng, J. ( China Institute of Metrology (China) )
Publication title:
Quantum optics and applications in computing and communications II : 10-12 November 2004, Beijing, China
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5631
Pub. Year:
2004
Page(from):
125
Page(to):
133
Pages:
9
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819455864 [0819455865]
Language:
English
Call no.:
P63600/5631
Type:
Conference Proceedings

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