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Error analysis for the far-field of diode lasers

Author(s):
Publication title:
Semiconductor Lasers and Applications II
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5628
Pub. Year:
2004
Page(from):
251
Page(to):
258
Pages:
8
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819455833 [0819455830]
Language:
English
Call no.:
P63600/5628
Type:
Conference Proceedings

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