Laser-induced damage of single-crystalline silicon under different 1064-nm Nd:YAG laser modes
- Author(s):
- Publication title:
- High-Power Lasers and Applications III
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5627
- Pub. Year:
- 2004
- Page(from):
- 286
- Page(to):
- 290
- Pages:
- 5
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819455826 [0819455822]
- Language:
- English
- Call no.:
- P63600/5627
- Type:
- Conference Proceedings
Similar Items:
SPIE-The International Society for Optical Engineering |
7
Conference Proceedings
The LIDT of Ta2O5/SiO2 narrow-band interference filters under different laser modes
SPIE - The International Society of Optical Engineering |
Society of Photo-optical Instrumentation Engineers |
8
Conference Proceedings
Single-shot and multishot laser-induced damage of HfO2/SiO2 multilayer at YAG third harmonic
SPIE - The International Society of Optical Engineering |
3
Conference Proceedings
Tatto removal in micropigs with low-energy pulses from a Q-switched Nd:YAG laser at 1064 nm
SPIE-The International Society for Optical Engineering |
9
Conference Proceedings
Temperature dependence of laser-induced damage threshold of 355-nm Al2O3/MgF2 HR coatings
SPIE - The International Society of Optical Engineering |
4
Conference Proceedings
Investigation of laser-induced damage of dielectric optical coatings (Invited Paper)
SPIE - The International Society of Optical Engineering |
10
Conference Proceedings
Investigation of diode-pumped 1064nm dual-frequency Nd:YAG laser with large frequency difference
Society of Photo-optical Instrumentation Engineers |
SPIE - The International Society of Optical Engineering |
11
Conference Proceedings
Portable l2-stabilized Nd:YAG laser for wavelength standards at 532 nm and 1064 nm
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
12
Conference Proceedings
Analysis of thermal stress damage in single-crystal silicon induced by 1064-nm long-pulse laser
Society of Photo-optical Instrumentation Engineers |