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Structural characterization of microcrystalline-amorphous hydrogenated silicon samples prepared by PECVD method

Author(s):
Orduna-Diaz, A. ( Ctr. de Investigacion en Ciencia Aplicada y Tecnologia-IPN (Mexico) )
Lopez, M. Rojas ( Ctr. de Investigacion en Ciencia Aplicada y Tecnologia-IPN (Mexico) )
Gayou, V. L. ( Ctr. de Investigacion en Ciencia Aplicada y Tecnologia-IPN (Mexico) )
Delgado-Macuil, R. J. ( Ctr. de Investigacion en Ciencia Aplicada y Tecnologia-IPN (Mexico) )
Mendez-Garcia, V. H. ( Instituto de Investigacion en Camunicacion Optica (Mexico) )
Perez-Blance, R. E. ( Benemerita Univ. Autonoma de Ciudad Juarez (Mexico) )
Rosendo, E. ( Benemerita Univ. Autonoma de Puebla (Mexico) )
2 more
Publication title:
RIAO/OPTILAS 2004: 5th Iberoamerican meeting on optics and 8th Latin American meeting on optics, lasers, and their applications: ICO regional meeting : 3-8 October 2004, Porlamar, Isla de Margarita, Venezuela
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5622
Pub. Year:
2004
Page(from):
1540
Page(to):
1543
Pages:
4
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819455758 [081945575X]
Language:
English
Call no.:
P63600/5622-3
Type:
Conference Proceedings

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