A new approach to iris pattern recognition

A new approach to iris pattern recognition

Author(s):

Du, Y. ( U. S. Naval Academy (USA) )
Ives, R. ( U. S. Naval Academy (USA) )
Etter, D. M. ( U. S. Naval Academy (USA) )
Welch, T. ( U. S. Naval Academy (USA) )

Publication title:

Electro-optical and infrared systems : technology and applications : 25-27 October 2004, London, United Kingdom

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5612

Pub. Year:

2004

Page(from):

104

Page(to):

116

Pages:

13

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819455659 [0819455652]

Language:

English

Call no.:

P63600/5612

Type:

Conference Proceedings

Details

TDL ID:	ZA00014818
Series ID:	PA00000029
Conf. info. (Name):	SPIE Security and Defence : Electro-Optical and Infrared Systems
Conf. info. (Number):	2004
Conf. info. (Venue):	London, UK
Conf. info. (Date):	2004.10.25-2004.10.27

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