An automatic inspection of SMT rectangular chips based on PCA algorithm.
- Author(s):
- Koh, K. -C. ( Sunmoon Univ. (South Korea) )
- Ko, K. W. ( Sunmoon Univ. (South Korea) )
- Choi, B. -W. ( Sunmoon Univ. (South Korea) )
- Kim, J. H. ( Seoul National Univ. of Technology (South Korea) )
- Cho, H. ( Korea Advanced Institute of Science and Technology (South Korea) )
- Publication title:
- Machine Vision and its Optomechatronic Applications
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5603
- Pub. Year:
- 2004
- Page(from):
- 208
- Page(to):
- 214
- Pages:
- 7
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819455567 [0819455563]
- Language:
- English
- Call no.:
- P63600/5603
- Type:
- Conference Proceedings
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