Development of automatic inspection of defect of compact camera module

Development of automatic inspection of defect of compact camera module

Author(s):

Ko, K. W. ( Sunmoon Univ. (South Korea) )
Lee, Y. J. ( Sunmoon Univ. (South Korea) )
Choi, B. -W. ( Sunmoon Univ. (South Korea) )
Koh, K. C. ( Sunmoon Univ. (South Korea) )
Kim, J. H. ( Seoul National Univ. of Technology (South Korea) )

Publication title:

Machine Vision and its Optomechatronic Applications

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5603

Pub. Year:

2004

Page(from):

191

Page(to):

198

Pages:

8

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819455567 [0819455563]

Language:

English

Call no.:

P63600/5603

Type:

Conference Proceedings

Details

TDL ID:	ZA00014809
Series ID:	PA00000029
Conf. info. (Name):	Optics East : Machine Vision and its Optomechatronic Applications
Conf. info. (Number):	2004
Conf. info. (Venue):	Philadelphia, PA, USA
Conf. info. (Date):	2004.10.26-2004.10.28

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