Characterization of sculptured thin films

Characterization of sculptured thin films

Author(s):

Ryan, J. V. ( The Pennsylvania State Univ. (USA) )
Horn, M. W. ( The Pennsylvania State Univ. (USA) )
Lakhtakia, A. ( The Pennsylvania State Univ. (USA) )
Pantano, C. G. ( The Pennsylvania State Univ. (USA) )

Publication title:

Nanosensing: Materials and Devices

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5593

Pub. Year:

2004

Page(from):

643

Page(to):

649

Pages:

7

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819455468 [0819455466]

Language:

English

Call no.:

P63600/5593

Type:

Conference Proceedings

Details

TDL ID:	ZA00014799
Series ID:	PA00000029
Conf. info. (Name):	Optics East : Nanosensing
Conf. info. (Number):	2004
Conf. info. (Venue):	Philadelphia, PA, USA
Conf. info. (Date):	2004.10.25-2004.10.28

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