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Six-port reflectometers for terahertz scattering parameter measurements using submillimeter-wavelength detectors (Invited Paper)

Author(s):
Weikle II, R. M. ( Univ. of Virginia (USA) )
Liu, Z. ( Univ. of Virginia (USA) )
Liu, H. ( Univ. of Virginia (USA) )
Liu, L. ( Univ. of Virginia (USA) )
Ulker, S. ( Girne American Univ. (Cyprus) )
Lichtenberger, A. W. ( Univ. of Virginia (USA) )
1 more
Publication title:
Nanofabrication: Technologies, Devices, and Applications
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5592
Pub. date:
2005
Page(from):
328
Page(to):
340
Pages:
13
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819455451 [0819455458]
Language:
English
Call no.:
P63600/5592
Type:
Conference Proceedings

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