Six-port reflectometers for terahertz scattering parameter measurements using submillimeter-wavelength detectors (Invited Paper)
- Author(s):
Weikle II, R. M. ( Univ. of Virginia (USA) ) Liu, Z. ( Univ. of Virginia (USA) ) Liu, H. ( Univ. of Virginia (USA) ) Liu, L. ( Univ. of Virginia (USA) ) Ulker, S. ( Girne American Univ. (Cyprus) ) Lichtenberger, A. W. ( Univ. of Virginia (USA) ) - Publication title:
- Nanofabrication: Technologies, Devices, and Applications
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5592
- Pub. Year:
- 2005
- Page(from):
- 328
- Page(to):
- 340
- Pages:
- 13
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819455451 [0819455458]
- Language:
- English
- Call no.:
- P63600/5592
- Type:
- Conference Proceedings
Similar Items:
SPIE - The International Society of Optical Engineering |
7
Conference Proceedings
SHARC II: a Caltech Submillimeter Observatory facility camera with 384 pixels (Invited Paper)
SPIE-The International Society for Optical Engineering |
SPIE - The International Society for Optical Engineering |
8
Conference Proceedings
Heterostructure barrier varactor (HBV) frequency multipliers for terahertz application
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
9
Conference Proceedings
Fabrication and characterization of terahertz photonic crystals (Invited Paper)
SPIE-The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE - The International Society of Optical Engineering |
5
Conference Proceedings
Recent progress by mid-IR antimonide type-II “W” interband cascade lasers and LWIR detectors (Invited Paper) [6386-16]
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
6
Conference Proceedings
Recent progress on photon-counting superconducting detectors for submillimeter astronomy (Invited Paper)
SPIE-The International Society for Optical Engineering |
SPIE-The International Society for Optical Engineering |