Electron microscopy investigation of pulsed-laser deposited hydroxylapatite thin films

Electron microscopy investigation of pulsed-laser deposited hydroxylapatite thin films

Author(s):

Werckmann, J. ( Institut de Physique et Chimie des Materiaux, CNRS (France) )
Iliescu, M. ( Institut de Physique et Chimie des Materiaux, CNRS (France) )
Nelea, V. ( Institut National des Sciences Appliquees de Strasbourg (France) )
Faerber, J. ( Institut de Physique et Chimie des Materiaux, CNRS (France) )
Mihailescu, I. N. ( National Institute for Laser, Plasma, and Radiation Physics (Romania) )

Publication title:

ROMOPTO 2003, Seventh Conference on Optics, 8-11 September 2003, Constanta, Romania

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5581

Pub. Year:

2004

Page(from):

333

Page(to):

344

Pages:

12

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819455345 [0819455342]

Language:

English

Call no.:

P63600/5581

Type:

Conference Proceedings

Details

TDL ID:	ZA00014787
Series ID:	PA00000029
Conf. info. (Name):	ROMOPTO - Conference on Optics
Conf. info. (Number):	2003 : 7th
Conf. info. (Venue):	Constanta, Romania
Conf. info. (Date):	2003.09.08-2003.09.11

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