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CD-measurement technique for hole patterns on stencil mask

Author(s):
Ishikawa, M. ( Dai Nippon Printing Co., Ltd. (Japan) )
Yusa, S. ( Dai Nippon Printing Co., Ltd. (Japan) )
Takikawa, T. ( Dai Nippon Printing Co., Ltd. (Japan) )
Fujita, H. ( Dai Nippon Printing Co., Ltd. (Japan) )
Sano, H. ( Dai Nippon Printing Co., Ltd. (Japan) )
Hoga, M. ( Dai Nippon Printing Co., Ltd. (Japan) )
Hayashi, N. ( Dai Nippon Printing Co., Ltd. (Japan) )
2 more
Publication title:
24th Annual BACUS Symposium on Photomask Technology
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5567
Pub. Year:
2004
Page(from):
1107
Page(to):
1116
Pages:
10
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819455130 [081945513X]
Language:
English
Call no.:
P63600/5567-2
Type:
Conference Proceedings

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