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Annealing behavior of vanadium oxide films prepared by modified ion-beam-enhanced deposition

Author(s):
  • Li, J. ( Jiangsu Polytechnic Univ. (China) )
  • Yuan, N. ( Jiangsu Polytechnic Univ. (China) )
  • Xie, J. ( Jiangsu Polytechnic Univ. (China) )
Publication title:
Infrared detector materials and devices : 4-5 August 2004, Denver, Colorado, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5564
Pub. Year:
2004
Page(from):
140
Page(to):
145
Pages:
6
Pub. info.:
Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819455024 [0819455024]
Language:
English
Call no.:
P63600/5564
Type:
Conference Proceedings

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