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Compact reconnaissance imaging spectrometer for Mars (CRISM): characterization results for instrument and focal plane subsystems

Author(s):
Silverglate, P. R. ( Johns Hopkins Univ. Applied Physics Lab. (USA) )
Heffernan, K. J. ( Johns Hopkins Univ. Applied Physics Lab. (USA) )
Bedini, P. D. ( Johns Hopkins Univ. Applied Physics Lab. (USA) )
Boldt, J. D. ( Johns Hopkins Univ. Applied Physics Lab. (USA) )
Cavender, P. J. ( Johns Hopkins Univ. Applied Physics Lab. (USA) )
Choo, T. H. ( Johns Hopkins Univ. Applied Physics Lab. (USA) )
Darlington, E. H. ( Johns Hopkins Univ. Applied Physics Lab. (USA) )
Donald, E. T. ( Johns Hopkins Univ. Applied Physics Lab. (USA) )
Fasold, M. J. ( Johns Hopkins Univ. Applied Physics Lab. (USA) )
Fort, D. E. ( Johns Hopkins Univ. Applied Physics Lab. (USA) )
Gurnee, R. S. ( Johns Hopkins Univ. Applied Physics Lab. (USA) )
Hayes, A. T. ( Johns Hopkins Univ. Applied Physics Lab. (USA) )
Hayes, J. R. ( Johns Hopkins Univ. Applied Physics Lab. (USA) )
Hemler, J. B. ( Johns Hopkins Univ. Applied Physics Lab. (USA) )
Humm, D. C. ( Johns Hopkins Univ. Applied Physics Lab. (USA) )
Izenberg, N. R. ( Johns Hopkins Univ. Applied Physics Lab. (USA) )
Lee, R. E. ( Johns Hopkins Univ. Applied Physics Lab. (USA) )
Lees, W. J. ( Johns Hopkins Univ. Applied Physics Lab. (USA) )
Lohr, D. A. ( Johns Hopkins Univ. Applied Physics Lab. (USA) )
Murchie, S. L. ( Johns Hopkins Univ. Applied Physics Lab. (USA) )
Murphy, G. A. ( Johns Hopkins Univ. Applied Physics Lab. (USA) )
Reiter, R. A. ( Johns Hopkins Univ. Applied Physics Lab. (USA) )
Rossano, E. ( Johns Hopkins Univ. Applied Physics Lab. (USA) )
Seagrave, G. G. ( Johns Hopkins Univ. Applied Physics Lab. (USA) )
Schaefer, E. D. ( Johns Hopkins Univ. Applied Physics Lab. (USA) )
Strohbehn, K. ( Johns Hopkins Univ. Applied Physics Lab. (USA) )
Taylor, H. W. ( Johns Hopkins Univ. Applied Physics Lab. (USA) )
Thompson, P. L. ( Johns Hopkins Univ. Applied Physics Lab. (USA) )
Tossman, B. E. ( Johns Hopkins Univ. Applied Physics Lab. (USA) )
Wilson IV, P. ( Johns Hopkins Univ. Applied Physics Lab. (USA) )
Robinson, M. S. ( Northwestern Univ. (USA) )
Green, R. ( Jet Propulsion Lab. and California Institute of Technology (USA) )
Mitchell, S. E. ( Univ. of Maryland/College Park (USA) )
28 more
Publication title:
Infrared systems and photoelectronic technology : 2-3, 5 August 2004, Denver, Colorado, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5563
Pub. date:
2004
Page(from):
98
Page(to):
110
Pages:
13
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819455017 [0819455016]
Language:
English
Call no.:
P63600/5563
Type:
Conference Proceedings

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