Further characterization of Rockwell Scientific LWIR HgCdTe detector arrays
- Author(s):
Bacon, C. M. ( Univ. of Rochester (USA) ) McMurtry, C. W. ( Univ. of Rochester (USA) ) Pipher, J. L. ( Univ. of Rochester (USA) ) Forrest, W. J. ( Univ. of Rochester (USA) ) Garnett, J. D. ( Rockwell Scientific Co. (USA) ) Lee, D. ( Rockwell Scientific Co. (USA) ) Edwall, D. D. ( Rockwell Scientific Co. (USA) ) - Publication title:
- Infrared systems and photoelectronic technology : 2-3, 5 August 2004, Denver, Colorado, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5563
- Pub. Year:
- 2004
- Page(from):
- 35
- Page(to):
- 45
- Pages:
- 11
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819455017 [0819455016]
- Language:
- English
- Call no.:
- P63600/5563
- Type:
- Conference Proceedings
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