Spectral irradiance responsivity measurements between 1 μm and 5 μm

Spectral irradiance responsivity measurements between 1 μm and 5 μm

Author(s):

Eppeldauer, G.P. ( National Institute of Standards and Technology (USA) )
Rice, J.P. ( National Institute of Standards and Technology (USA) )
Zhang, J. ( National Institute of Standards and Technology (USA) )
Lykke, K.R. ( National Institute of Standards and Technology (USA) )

Publication title:

Infrared spaceborne remote sensing XII : 2-3 August 2004, Denver, Colorado, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5543

Pub. Year:

2004

Page(from):

248

Page(to):

257

Pages:

10

Pub. info.:

Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819454812 [0819454818]

Language:

English

Call no.:

P63600/5543

Type:

Conference Proceedings

Details

TDL ID:	ZA00014744
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : Infrared Space borne Remote Sensing
Conf. info. (Number):	2004 : 12th
Conf. info. (Venue):	Denver, CO, USA
Conf. info. (Date):	2004.08.02-2004.08.03

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