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4π Compton imaging with single 3D position-sensitive CdZnTe detector

Author(s):
  • Xu, D. ( Univ. of Michigan/Ann Arbor (USA) )
  • He, Z. ( Univ. of Michigan/Ann Arbor (USA) )
  • Lehner, C.E. ( Univ. of Michigan/Ann Arbor (USA) )
  • Zhang, F. ( Univ. of Michigan/Ann Arbor (USA) )
Publication title:
Hard X-Ray and Gamma-Ray Detector Physics VI
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5540
Pub. date:
2004
Page(from):
144
Page(to):
155
Pages:
12
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819454782 [0819454788]
Language:
English
Call no.:
P63600/5540
Type:
Conference Proceedings

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