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Eliminating beam-hardening artifacts in high-energy industrial computed tomography (ICT)

Author(s):
Publication title:
Developments in X-ray tomography IV : 4-6 August, 2004, Denver, Colorado, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5535
Pub. Year:
2004
Page(from):
765
Page(to):
774
Pages:
10
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819454737 [0819454737]
Language:
English
Call no.:
P63600/5535
Type:
Conference Proceedings

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