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Tomographic x-ray absorption spectroscopy

Author(s):
Schroer, C.G. ( Aachen Univ. (Germany) and HASYLAB/Deutches Electronen-Synchrotron (Germany) )
Kuhlmann, M. ( Aachen Univ. (Germany) )
Gunzler, T.F. ( Aachen Univ. (Germany) )
Lengeler, B. ( Aachen Univ. (Germany) )
Richwin, M. ( Bergische Univ. Wuppertal (Germany) )
Griesebock, B. ( Bergische Univ. Wuppertal (Germany) )
Lutzenkirchen-Hecht, D. ( Bergische Univ. Wuppertal (Germany) )
Frahm, R. ( Bergische Univ. Wuppertal (Germany) )
Ziegler, E. ( European Synchrotron Radiation Facility (France) )
Mashayekhi, A. ( Argonne National Lab. (USA) )
Haeffner, D.R. ( Argonne National Lab. (USA) )
Grunwaldt, J.-D. ( ETH Honggerberg (Switzerland) )
Baiker, A. ( ETH Honggerberg (Switzerland) )
8 more
Publication title:
Developments in X-ray tomography IV : 4-6 August, 2004, Denver, Colorado, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5535
Pub. date:
2004
Page(from):
715
Page(to):
723
Pages:
9
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819454737 [0819454737]
Language:
English
Call no.:
P63600/5535
Type:
Conference Proceedings

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