The evolution of hard x-ray tomography from the micrometer to the nanometer length scale

Peterson, K.M. ( Univ. of Illinois/Urbana-Champaign (USA) )

Jemian, P.R. ( Univ. of Illinois/Urbana-Champaign (USA) )

Terry, T. ( Purdue Univ. (USA) )

Harris, M.T. ( Purdue Univ. (USA) )

Vogt, S. ( Argonne National Lab. (USA) )

Richter, C.-P. ( Northwestern Univ. (USA) )

Neuhausler, U. ( Univ. Bielefeld (Germany) )

Schneider, G. ( BESSY GmbH (Germany) )

Robinson, I.K. ( Univ. of Illinois/Urbana-Champaign (USA) )

5 more

Publication title:

Developments in X-ray tomography IV : 4-6 August, 2004, Denver, Colorado, USA

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5535

Pub. Year:

2004

Page(from):

709

Page(to):

714

Pages:

6

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819454737 [0819454737]

Language:

English

Call no.:

P63600/5535

Type:

Conference Proceedings

Details

TDL ID:	ZA00014736
Series ID:	PA00000029
Conf. info. (Name):	Optics & Photonics : Developments in X-ray tomography
Conf. info. (Number):	2004 : 4th
Conf. info. (Venue):	Denver, CO, USA
Conf. info. (Date):	2004.08.04-2004.08.06

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