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Study of short-term instabilities of InGaN/GaN Light-emitting diodes by means of capacitance-voltage measurements and deep-level transient spectroscopy

Author(s):
Meneghesso, G. ( Univ. degli Studi di Padova (Italy) )
Meneghini, M. ( Univ. degli Studi di Padova (Italy) )
Levada, S. ( Univ. degli Studi di Padova (Italy) )
Zanoni, E. ( Univ. degli Studi di Padova (Italy) )
Cavallini, A. D. M. ( Univ. di Bologna (Italy) )
Castaldini, A. ( Univ. di Bologna (Italy) )
Hdrle, V. ( OSRAM Opto Semiconductors GmbH (Germany) )
Zahner, T. ( OSRAM Opto Semiconductors GmbH (Germany) )
Zehnder, U. ( OSRAM Opto Semiconductors GmbH (Germany) )
4 more
Publication title:
Fourth international conference on solid state lighting : 3-6 August 2004, Denver, Colorado, USA
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5530
Pub. Year:
2004
Page(from):
251
Page(to):
259
Pages:
9
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0227786x
ISBN:
9780819454683 [0819454680]
Language:
English
Call no.:
P63600/5530
Type:
Conference Proceedings

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