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X-ray analysis of strain relaxation in multilayer systems InxGa1-xAS1-yNy/GaAs

Author(s):
Pessa, M. ( Tampere Univ. of Technology (Finland) )
Pavelescu, E.-M. ( Tampere Univ. of Technology (Finland) )
Fodchuk, I. M. ( Chernivtsi National Univ. (Ukraine) )
Gevyk, V. B. ( Chernivtsi National Univ. (Ukraine) )
Shpak, A. P. ( Institute of Metal Physics (Ukraine) )
Molodkin, V. B. ( Institute of Metal Physics (Ukraine) )
Kislovskii, E. N. ( Institute of Metal Physics (Ukraine) )
Olikhovskii, S. I. ( Institute of Metal Physics (Ukraine) )
3 more
Publication title:
Sixth International Conference on Correlation Optics : 16-19 September 2003, Chernivtsi, Ukraine
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5477
Pub. Year:
2004
Page(from):
229
Page(to):
237
Pages:
9
Pub. info.:
Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819454034 [0819454036]
Language:
English
Call no.:
P63600/5477
Type:
Conference Proceedings

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