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New principles of diagnostics of surface parameters of solids by methods of x-ray total external reflection

Author(s):
Publication title:
Sixth International Conference on Correlation Optics : 16-19 September 2003, Chernivtsi, Ukraine
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5477
Pub. Year:
2004
Page(from):
198
Page(to):
205
Pages:
8
Pub. info.:
Bellingham, Wash., USA: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819454034 [0819454036]
Language:
English
Call no.:
P63600/5477
Type:
Conference Proceedings

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