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Direct extraction of McWhorter's constant from LFN spectra of MOSFETs with planar layers of Si nanocrystals embedded in gate SiO2

Author(s):
Ferraton, S. ( IMEP-CNRS (France) )
Zimmermann, J. ( IMEP-CNRS (France) )
Montres, L. ( IMEP-CNRS (France) )
Ghibaudo, G. ( IMEP-CNRS (France) )
Brini, J. ( IMEP-CNRS (France) )
Gurgul, J. ( CEA-LETI (France) and Univ. Jagielionski (Poland) )
Chroboczek, J. A. ( CEA-LETI (France) )
2 more
Publication title:
Noise in devices and circuits II : 26-28 May 2004, Maspalomas, Gran Canaria, Spain
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5470
Pub. Year:
2004
Page(from):
560
Page(to):
565
Pages:
6
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819453969 [081945396X]
Language:
English
Call no.:
P63600/5470
Type:
Conference Proceedings

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