Simulation of cyclostationary noise in semiconductor devices (Invited paper)
- Author(s):
- Guerrieri, S. Donati ( Politecnico di Torino (Italy) )
- Bonani, F. ( Politecnico di Torino (Italy) )
- Ghione, G. ( Politecnico di Torino (Italy) )
- Publication title:
- Noise in devices and circuits II : 26-28 May 2004, Maspalomas, Gran Canaria, Spain
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5470
- Pub. Year:
- 2004
- Page(from):
- 307
- Page(to):
- 321
- Pages:
- 15
- Pub. info.:
- Bellingham, Wash.: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819453969 [081945396X]
- Language:
- English
- Call no.:
- P63600/5470
- Type:
- Conference Proceedings
Similar Items:
1
Conference Proceedings
Small- and large-signal trap-assisted GR noise modeling in semiconductor devices
SPIE - The International Society of Optical Engineering |
7
Conference Proceedings
Microscopic investigation of large-signal noise in semiconductor materials and devices (Invited Paper)
SPIE-The International Society for Optical Engineering |
2
Conference Proceedings
CAD-Oriented,Physics-Based Large-and Small-Signal Noise Analysis of Bipolar Semiconductor Devices
Trans Tech Publications |
8
Conference Proceedings
Noise analysis of gain-clamped and conventional semiconductor optical amplifiers
SPIE - The International Society for Optical Engineering |
SPIE - The International Society of Optical Engineering |
SPIE-The International Society for Optical Engineering |
Kluwer Academic Publishers |
SPIE-The International Society for Optical Engineering |
5
Conference Proceedings
Design, Fabrication and Characterization of 1.5 mΩcm2, 800 V 4H-SiC n-Type Schottky Barrier Diodes
Trans Tech Publications |
11
Conference Proceedings
Organic semiconductor devices for micro-optical applications (Invited Paper) [6185-05]
SPIE - The International Society of Optical Engineering |
6
Conference Proceedings
The influence of noise on the dynamics of semiconductor lasers (Invited Paper)
SPIE - The International Society of Optical Engineering |
12
Conference Proceedings
Generation-recombination noise in GaN and GaN-based devices (Invited Paper)
SPIE-The International Society for Optical Engineering |