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Noise in Si/SiGe and Ge/SiGe MODFET (Invited Paper)

Author(s):
Aniel, F. P. ( Univ. Paris-Sud (France) )
Enciso-Aguilar, M. ( Univ. Paris-Sud (France) )
Rodriguez, M. ( Univ. Paris-Sud (France) )
Zerounian, N. ( Univ. Paris-Sud (France) )
Crozat, P. ( Univ. Paris-Sud (France) )
Hackbarth, T. ( DaimlerChrysler (Germany) )
Herzog, J.-H. ( DaimlerChrysler (Germany) )
2 more
Publication title:
Noise in devices and circuits II : 26-28 May 2004, Maspalomas, Gran Canaria, Spain
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5470
Pub. Year:
2004
Page(from):
107
Page(to):
121
Pages:
15
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819453969 [081945396X]
Language:
English
Call no.:
P63600/5470
Type:
Conference Proceedings

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