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Nonlocal transport and thermal noise of the nanoscale MOSFET

Author(s):
  • Jin, S. ( Seoul National Univ. (South Korea) )
  • Hong, S. ( Seoul National Univ. (South Korea) )
  • Kim, J. ( Seoul National Univ. (South Korea) )
  • Park, Y. J. ( Seoul National Univ. (South Korea) )
  • Min, H. S. ( Seoul National Univ. (South Korea) )
Publication title:
Noise in devices and circuits II : 26-28 May 2004, Maspalomas, Gran Canaria, Spain
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5470
Pub. date:
2004
Page(from):
74
Page(to):
83
Pages:
10
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819453969 [081945396X]
Language:
English
Call no.:
P63600/5470
Type:
Conference Proceedings

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