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Resistance noise scaling in a two-dimensional hole system in GaAs (Invited Paper)

Author(s):
Leturcq, R. ( CEA Saclay (France) )
Deville, G. ( CEA Saclay (France) )
L'Hote, D. ( CEA Saclay (France) )
Tourbot, R. ( CEA Saclay (France) )
Mellor, C. J. ( Univ. of Nottingham (United Kingdom) )
Henini, M. ( Univ. of Nottingham (United Kingdom) )
1 more
Publication title:
Fluctuations and noise in materials : 26-28 May, 2004, Maspalomas, Gran Canaria, Spain
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5469
Pub. Year:
2004
Page(from):
101
Page(to):
113
Pages:
13
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819453921 [0819453927]
Language:
English
Call no.:
P63600/5469
Type:
Conference Proceedings

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