Surface plasmon resonance heterodyne interferometry for measuring physical parameters

Surface plasmon resonance heterodyne interferometry for measuring physical parameters

Author(s):

Su, D. -C. ( National Chiao Tung Univ. (Taiwan) )
Chen, J. -H. ( National Chiao Tung Univ. (Taiwan) )
Chen, K. -H. ( National Chiao Tung Univ. (Taiwan) )
Lin, J. -Y. ( National Chiao Tung Univ. (Taiwan) )

Publication title:

Optical Metrology in Production Engineering

Title of ser.:

Proceedings of SPIE - the International Society for Optical Engineering

Ser. no.:

5457

Pub. Year:

2004

Page(from):

566

Page(to):

573

Pages:

8

Pub. info.:

Bellingham, Wash.: SPIE - The International Society of Optical Engineering

ISSN:

0277786X

ISBN:

9780819453792 [081945379X]

Language:

English

Call no.:

P63600/5457

Type:

Conference Proceedings

Details

TDL ID:	ZA00014648
Series ID:	PA00000029
Conf. info. (Name):	Photonics Europe : Optical metrology in production engineering
Conf. info. (Number):	2004
Conf. info. (Venue):	Strasbourg, France
Conf. info. (Date):	2004.04.27-2004.04.30

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