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A 3D scanning device for architectural survey based on time-of-flight technology

Author(s):
Fontana, R. ( Istituto Nazionale di Ottica Applicata (Italy) )
Gambino, M. C. ( Istituto Nazionale di Ottica Applicata (Italy) )
Gianfrate, G. ( Univ. degli Studi di Lecce (Italy) )
Greco, M. ( Istituto Nazionale di Ottica Applicata (Italy) )
Pampaloni, E. ( Istituto Nazionale di Ottica Applicata (Italy) )
Pezzati, L. ( Istituto Nazionale di Ottica Applicata (Italy) )
1 more
Publication title:
Optical Metrology in Production Engineering
Title of ser.:
Proceedings of SPIE - the International Society for Optical Engineering
Ser. no.:
5457
Pub. Year:
2004
Page(from):
393
Page(to):
400
Pages:
8
Pub. info.:
Bellingham, Wash.: SPIE - The International Society of Optical Engineering
ISSN:
0277786X
ISBN:
9780819453792 [081945379X]
Language:
English
Call no.:
P63600/5457
Type:
Conference Proceedings

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