A new method to measure the signal quality for high-density recording systems
- Author(s):
Cho, E. -S. ( Samsung Advanced Institute of Technology (South Korea) ) Lee, J. -W. ( Samsung Advanced Institute of Technology (South Korea) ) Lee, J. ( Samsung Advanced Institute of Technology (South Korea) ) Ryu, E. -J. ( Samsung Advanced Institute of Technology (South Korea) ) Konakov, M. ( Samsung Advanced Institute of Technology (South Korea) ) Shim, J. -S. ( Samsung Electronics Co., Ltd. (South Korea) ) Park, H. -S. ( Samsung Electronics Co., Ltd. (South Korea) ) - Publication title:
- Optical data storage 2004 : 18-21 April 2004, Monterey, California, USA
- Title of ser.:
- Proceedings of SPIE - the International Society for Optical Engineering
- Ser. no.:
- 5380
- Pub. Year:
- 2004
- Page(from):
- 83
- Page(to):
- 89
- Pages:
- 7
- Pub. info.:
- Bellingham: SPIE - The International Society of Optical Engineering
- ISSN:
- 0277786X
- ISBN:
- 9780819452931 [0819452939]
- Language:
- English
- Call no.:
- P63600/5380
- Type:
- Conference Proceedings
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